QSSPL, and determination of bulk doping with PC and PL

Ziv Hameiri (UNSW)

SOLAR SEMINAR SERIES

DATE: 2011-09-07
TIME: 15:00:00 - 15:30:00
LOCATION: Ian Ross Seminar Room
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ABSTRACT:
Ziv will discuss his last Euro conf paper for measuring bulk doping in test structures. Hopefully he will also discuss QSSPL and present some data. This is a technique that measures photo-injected carriers contactlessly from a wafer and is extremely sensitive. Hence, it is ideal for measuring effective lifetimes of silicon at very-low injection (down to 10^8/cm3).
BIO:
Ziv is a post-doc working at BTimaging/UNSW. Soon however, he is off to more humid shores - SERIS in Singapore.